UNI-T UTS3000T+ Series Spectrum Analyzers

UNI-T's UTS3000T+ Series Spectrum Analysers are designed for high-precision frequency analysis up to 8.4 GHz, offering wideband coverage and superior performance. Built with all-digital IF technology, they provide accurate and reliable measurements, supporting a variety of advanced analysis functions. These analysers deliver detailed signal insights with up to 40,001 scanning points, ensuring precise frequency domain evaluations.

A 10.1-inch touchscreen display enhances user experience, allowing for intuitive operation and quick data access. The UTS3000T+ series is well-suited for functional, terminal, and quality inspection tests in electronics manufacturing, as well as applications in wireless communication, RF and microwave education, electromagnetic compatibility (EMC) pre-scanning, and semiconductor testing.

Key Features

• Models boast a wide frequency measurement range from 9 kHz to 1.5 GHz (UTS3015T+) / 3.2 GHz (UTS3032T+) / 3.6 GHz (UTS3036T+) / 8.4 GHz (UTS3084T+).
• Ultra-low displayed average noise level: As low as -161 dBm (typical) for enhanced signal clarity.
• Low phase noise: <-98 dBc/Hz at a 10 kHz offset (typical) for stable and precise measurements.
• High amplitude accuracy: Within ±0.7 dB, ensuring reliable signal analysis.
• Up to 40,001 scanning points: For detailed and comprehensive frequency domain analysis.
• Fine resolution bandwidth (RBW): 1 Hz minimum, allowing for precise signal differentiation.
• One-key measurement function (optional): Simplifies complex testing procedures.
• EMI pre-compliance analysis (optional): Enables early-stage electromagnetic interference testing.
• Analog demodulation analysis support (optional): For assessing modulation characteristics.
• Integrated tracking source output: Enhances signal testing and analysis capabilities.
• Large 10.1-inch HD capacitive touchscreen: 1280 × 800 resolution for intuitive operation.
• Versatile connectivity: Includes USB and LAN interfaces, with SCPI protocol support for seamless integration into automated testing systems.